900-1700nm range

The evolution of CMOS sensor technology, driven by demand for compact, high-performance imaging systems under strict size and power constraints, has enabled significant advancements in digital microscopy. Short-wave infrared (SWIR) modular microscopes, exemplified by systems like the EHD SWIR microscope, now provide transformative capabilities for industrial and scientific applications by extending imaging beyond the traditional visible spectrum (400–700 nm) into the 900–1700 nm range.

SWIR modular microscopy bridges the gap between conventional optical systems and specialized IR imaging, offering unparalleled precision for next-generation material and electronic inspection.

SWIR modular microscopes are critical in:
1. Semiconductor Manufacturing: Detecting subsurface defects in silicon wafers and chip interconnects.
2. Materials Science: Identifying invisible cracks in ceramics or composite materials.
3. Industrial Inspection: Analyzing subsurface structures in components without destructive disassembly